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OPA2810 Rail-to-Rail HV FET-Input Operational Amplifier

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OPA2810 Rail-to-Rail HV FET-Input Operational Amplifier

TI's OPA2810 dual-channel, FET-input op amp for high-fidelity data acquisition and signal processing applications

Texas Instruments' OPA2810 is a dual-channel, FET-input, voltage-feedback operational amplifier with low input bias current. It is unity-gain stable with a small-signal unity-gain bandwidth of 105 MHz and offers excellent DC precision and dynamic AC performance at a low quiescent current (IQ) of 3.6 mA per channel (typical). This op amp is fabricated on Texas Instruments' proprietary, high-speed SiGe BiCMOS process and achieves significant performance improvements over comparable FET-input amplifiers at similar levels of quiescent power. With a gain-bandwidth product (GBWP) of 70 MHz, slew-rate of 192 V/µs, and voltage low-noise of 6 nV/√ Hz, the OPA2810 is well-suited for use in a wide range of high fidelity data acquisition and signal processing applications.

This device is characterized to operate over a wide supply range of 4.75 V to 27 V and features rail-to-rail inputs and outputs. The OPA2810 amplifier delivers 75 mA of linear output current, suitable for driving optoelectronics components and analog-to-digital converter (ADC) inputs or buffering digital-to-analog converter (DAC) outputs into heavy loads.

This op amp is available in an 8-pin, SOT23-8, and VSSOP-8 package and is rated to work over the extended industrial temperature range of -40°C to +125°C.

  • Gain-bandwidth product: 70 MHz
  • Small-signal bandwidth: 105 MHz
  • Slew-rate: 192 V/µs
  • Wide supply range: 4.75 V to 27 V
  • Low noise:
    • Input voltage noise: 6 nV/√Hz (f = 500 kHz)
    • Input current noise: 5 fA/√Hz (f = 10 kHz)
  • Rail-to-rail input and output:
    • FET input stage: 2 pA input bias current (typ.)
    • High-linear output current: 75 mA
  • Input offset: ±1.5 mV (max.)
  • Offset drift: ±2 µV/°C (typ.)
  • Low power: 3.6 mA/channel
  • Extended temperature operation: -40°C to +125°C
  • Wideband photodiode transimpedance amplifiers
  • High-z front-ends
  • Impedance measurements
  • Power analyzers
  • Multi-channel sensor interface
  • Level shifting and buffering
  • Optoelectronic drivers